IEEE International Workshop
on
Defects, Adaptive Test, Yield and Data Analysis
(DATA-2016)
Nov 17-18 2016
Fort Worth, TX
|
|
|
Submission Deadline: October 7, 2016 (extended)
Notification of Acceptance: October 21, 2016
Camera Ready Paper (.pdf): November 4, 2016
Final Presentation Slides (.ppt): November 9, 2016
DATA-2016 will be held in conjunction with ITC 2016
|
THEME: “Toward Real Time Understanding”
The scope of the DATA workshop once again returns to our common theme, which has always been DATA, specifically, semiconductor test and yield data. We in the semiconductor industry create billions of data points every hour, and we’ve made great strides in capturing, storing, and analyzing these data. As the cost of storage falls, and query and analysis capabilities become ever more powerful, the next horizon for DATA professionals is Real Time Understanding. How quickly can we turn our copious data from wafer sort, final test, in-line defect inspection, etc. into an understanding that leads to immediate or even pre-emptive action? The time and cost pressures we’re facing as an industry make the move towards short-loop process improvement an imperative.
The Organizing Committee for the DATA-2016 Workshop is soliciting papers in the area of semiconductor test, yield analysis, learning, and improvement. Of particular interest are advanced techniques and new tools for approaching Real Time Understanding of yield loss drivers, tester & manufacturing efficiency, & outlier detection in semiconductor manufacturing, including implementation of adaptive test. Preference will be given to real-world case studies.
Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style “Spot-Light” presentations describing industrial experiences or research are also invited.
|
|
To present at the workshop, send to arani.sinha@intel.com a PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by October 7, 2016. Each submission should include full name and address of each author, affiliation, telephone number, FAX and Email address. Camera-ready papers for inclusion in the digest of papers will be due on November 4, 2016.
|
|
DATA-2016 is sponsored by:
DATA-
2016 is
spon
|
Corporate Sponsors:
|
Platinum
|
|
Silver
|
Suggested Topics
|
Real Time Analysis Methods
Real Time Test Process Monitoring
Yield Learning and Analysis
Analog Fault modeling and coverage
Analog effects in Digital Logic
Embedded Instrumentation (iJTAG)
Advanced dppm reduction & reliability improvement techniques
|
Data Acquisition & Transport
Adaptive Test for Product Engineers
Data Analysis methods, including
multivariate data
Fault Localization and Diagnosis
Data storage and security
I/O Test, Tuning, and Adjustment
Product and Project Case studies
|
|