DATA-2012
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November 8-9, 2012 Disneyland Hotel, Anaheim, CA IEEE
International Workshop on Defect and Adaptive Test Analysis (DATA-2012) Register by Oct. 5 to get the discounted registration rates Notification of Acceptance: September 15, 2012 Camera Ready Paper: October 15, 2012 Final Presentation Slides: November 2, 2012 DATA-2012 will be held in conjunction with ITC 2012 |
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It just never stops. Every year silicon wafer
process technology continues to shrink, more transistors and functions are
included into designs, and customers continue to demand even lower dppm. Meanwhile our bosses and managers are always
looking at test as an area to reduce product cost, and they expect us to be
able to reduce our test costs while also meeting these newer and tougher test
challenges and quality goals. So how do we do it? “How to get more out of
test” has led to new methods to learn about defects and IC behavior
through the use of innovative analysis techniques. Now questions about how
these techniques should be executed and controlled in production, the types
and sizes of databases, and even the format and storage of test data itself
are becoming critical. Complex problems, such as the control and
documentation of dynamic test changes during Adaptive Test, ensuring high
quality levels without test escapes, and the practical and realistic
limitations of new ideas for board/system testing are all hot industry
topics. Closing the knowledge gap about these issues, the processes, the new
test techniques, new database requirements, and how defect models and failure
data can be used to adapt test flows are the goals of the DATA workshop. Presentations related to the topics listed below, including papers, case studies, and posters, are being requested for the 2012 workshop on Defect and Adaptive Test Analysis:
To present
at the workshop, send to Arani.Sinha@INTEL.com a PDF version of an extended abstract
of at least 1000 words or a full paper (Max 10 pages, double column, 11pt
font size, IEEE proceeding format) by August
30, 2012. Each submission should include full name and address of
each author, affiliation, telephone number, FAX and Email address.
Camera-ready papers for inclusion in the digest of papers will be due on Oct 15, 2012. Presentations on
cutting edge test technology, innovative test ideas, and industrial practices
and experience are welcome. Ideas or proposals for Embedded Tutorials,
Debates, Panel Discussions or “Spot-Light” presentations
describing industrial experiences are also invited.
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