DATA-2012

 

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Call for Paper (pdf)

Paper Submission

ITC 2012

Final Program

Organizing/Program Committee

Registration

Hotel/Travel

The IEEE International Workshop on

Defect and Adaptive Test Analysis (DATA-2012)

(Formerly known as Defect and Data Driven Testing Workshop (D3T))

 

Nov. 8-9, 2012 Disneyland Hotel, Anaheim, CA

Will be held in conjunction with ITC Test Week (ITC-2012)

 

 

Previous Events

DATA-2011

D3T workshop

 

 

 

Technical Committee

 

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 PROGRAM CHAIR

Arani Sinha

Intel

 

GENERAL CHAIR

Jeff Roehr

Texas Instruments

VICE-PROGRAM CHAIR

Jennifer Dworka

SMU

FINANCE CHAIR

Sankaran M. Menon

Intel Corporation

 

 

PUBLICITY CHAIR

Kanad Chakraborty

Lattice Semi

 

PUBLICATION CHAIR

Chintan Patel

UMBC

 

 

 

PANEL CHAIR

Wesley Smith

Galaxy

PROGRAM COMMITTEE

Rob Aitken, ARM

Tom Bartenstein, Cadence

Nemat Bidokhti, Cisco

Ken Butler, TI

Krish Chakrabarty, Duke Univ.

Sreejit Chakravarty, LSI

John Carulli, TI

Bruce Cory, Nvidia

Jennifer Dworak, SMU

Patrick Girard, LIRRM

Sandeep Goel, TSMC

Rohit Kapur, Synopsys

Ajay Koche, Consultant

Mike Laisne, Qualcomm

Nilanjan Mukherjee, Mentor Graphics

Teresa McLaurin, ARM

Amit Nahar, TI

Suriyaprakash Natarajan, Intel

Jay Orbon, Verigy

John Potter, Asset-Intertech

Rajesh Raina, Freescale

Mani Soma, U Washington

Claude Thibeault, Ecole Tech

Li C. Wang, UCSB

Xiaoqing Wen, Kyushu Institute of Tech, Japan

LeRoy Winemberg, Freescale

Qiang Xu, CUHK

Mahmut Yilmaz, Nvidia

STEERING COMMITTEE

Sankaran Menon, Intel

Adit Singh, Auburn Univ.

M. Tehranipoor, U Connecticut

Hank Walker, Texas A&M

Hans Manhaeve, Q-Start Test

Jim Plusquellic, U. New Mexico