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IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA-2017)
Nov 2-3 2017
Fort Worth, TX |
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Program (Times are subject to change) |
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Thursday, November 2, 2017 |
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4:00 p.m. - 4:15 p.m. |
Welcome to DATA: Jeffrey Roehr |
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4:15 p.m. - 5:00 p.m. |
Keynote "Real-Time Floor Monitoring" Stacy Ajouri, Texas Instruments |
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5:00 p.m. - 6:30 p.m. |
Panel Discussion "Breaking Down Data Barriers" Panel Moderator: Anne Meixner, Consultant Participants: |
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Rao Desineni, Global Foundries Stacy Ajouri, Texas Instruments Srikanth Venkataraman, Intel |
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7:00 p.m. - 9:00 p.m. |
Workshop Reception |
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Friday, November 3, 2017 |
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8:00 a.m. - 8:15 a.m. |
Machine Learning Welcome: |
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8:15 a.m. - 9:15 a.m. |
Keynote - Machine Learning Dr. Peng Cheng Liu, Lead Data Scientist, Siemens PLM |
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9:15 a.m. - 10:00 a.m. |
Machine Learning - Analog Test: ChoonWee Koay, Intel |
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10:00 a.m.- 10:30 a.m. |
Coffee Break |
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10:30 a.m.- 11:15 a.m. |
Machine Learning - Synergy: Sam Jonaidi, Automation Technology 88 |
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11:15 a.m. - Noon |
Machine Learning - Diagnosis: Dr. Shawn Blanton, Carnegie Mellon University |
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Noon - 1:00 p.m. |
Workshop Lunch |
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1:00 p.m. - 1:45 p.m. |
Machine Learning - Wafer Application: Ali Ahmadi, Global Foundries |
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1:45 p.m. - 2:30 p.m. |
Machine Learning - System Test: Shi Jin, Duke University |
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2:30 p.m. - 3:00 p.m. |
Friday Afternoon Break |
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3:00 p.m. - 3:45 p.m. |
Machine Learning - Security: Al Crouch, Amida Technology Solutions |
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3:45 p.m. - 4:00 p.m. |
Closing Remarks
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DATA-2017 is sponsored by:
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Corporate Sponsors: |
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Platinum |
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Silver |
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