Call for Paper (pdf)

Paper Submission

Final Program

ITC 2011

Organizing/Program Committee



The IEEE International Workshop on

Defect and Adaptive Test Analysis (DATA-2011)


Sep.22-23, 2011 Disneyland Hotel, Anaheim, CA

Will be held in conjunction with ITC Test Week (ITC-2011)


Previous Events

D3T workshop




Final Program



Day 1 - Thursday, Sep. 22


4:00pm - Opening Remarks:  

Sankaran Menon (Intel Corporation, USA), General Chair, DATA

Jeffrey Roehr (Texas Instruments, USA), Program Chair, DATA


4:15pm - 5:00pm

Keynote: Srikanth Venkataraman (Intel Corporation, USA)



5:00pm - 6:30pm

Session 1: Adaptive Test: The European View

Chair – Al Crouch (Asset-Intertech, USA)


5.00 - 5.30: Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation
                              Harm Bossers, Johann Hurink and Gerard Smit (University of Twente, Netherlands)

5.30 - 6.00: Concurrent Test Method for Test Time Reduction in Production of Mobile Devices
                              Amir Owzar, E. Baykal, P. Felicio, R. Teng, G. Valchera, R. Becker (STEricsson, Switzerland)

6.00 - 6.30: A Holistic Approach to use Manufacturing Test Data for the Learning of Yield, Design Issues and

                 Improve Test Process Operational Performances
                             Davide Appello, Chris Portelli, Domenico Chindamo, Alex Chufarowsky and Marco Esposito (OptimalTest and STMicroelectronics)




Day 2 - Friday, Sep. 23


Workshop Welcome Reception - 7:00pm - 9:00pm


8:00am - 9:30am

Session 2: ABCs of Adaptive Test

Chair – Sankaran Menon (Intel Corporation, USA)


8.00 - 9.00: What Engineers need to know to implement the ITRS roadmap for Adaptive Test
                              Jeffrey Roehr (Texas Instruments, USA)

9.00 - 9.30: ATPG and DFT for Adaptive Test: Can we plan ahead in the flow?
                              Arani Sinha (Advanced Micro Devices, USA)



9:30am - 10:30am

Session 3: Data Mining and Adaptive Test

Chair – Jeff Roehr (Texas Instruments, USA)


9.30 - 10.00:   Debug and Data Mining (Invited talk)
                                 Nikhil Dakwala (Broadcom, USA)

10.00 - 10.30: Adaptive Test Beyond the Component Level (Invited talk)
                                 Mathias Kamm (Cisco, USA)



Coffee Break- 10:30am - 10:50am


10:50am - 11:50am

Session 4: Noise and Reliability

Chair – Al Crouch (Asset-Intertech, USA)


10.50 - 11.20:  Novel Test Structures for Reliability and Noise Analysis (Invited talk)
                                  Mohammad Tehranipoor (University of Connecticut)
                                  (Collaboration with Xiaoxiao Wang, LeRoy Winemberg, Freescale)

11.20 - 11.50: Analyzing the Impact of Power Supply Noise on Propagation Delay
                                 Sushmita Kadiyala Rao, Chaitra Sathyanarayana, Ryan Robucci and Chintan Patel, (University of Maryland, Baltimore)


Lunch - 11:50 pm - 1:00pm


1:00pm - 2:30pm

Session 5: From Yield to Adaptive Test 

Chair – Nisar Ahmed (Freescale, USA)


1.00 - 1.30:  Yield/Area maximization of Logic Circuits: From Theorem to Implementation
                              Mohammad Mirza-Aghatabar, Melvin Breuer and Sandeep Gupta (University of Southern California, Los Angeles)

1.30 - 2.00: DACS: Data Aware Component Salvaging in Presence of Microprocessor Integer Functional Unit Delay Faults
                             Yue Gao and Melvin Breuer (University of Southern California, Los Angeles)

2.00 - 2.30: Adaptive Group Testing - a DUT Response Technique applied in Semiconductor Test
                             Gunther Karner and Ivica Rogina (OptimiSE GmbH, Karlsruhe)


2:30pm - 4:00 pm - Panel Discussion

Calling 007: How Secure is Our Data?



Al Crouch (Asset-Intertech, USA)

Jennifer Dworak (Southern Methodist University, USA)