DATA-2011 Home Call for Paper (pdf) Paper Submission Final Program ITC 2011 Organizing/Program Committee Registration Hotel/Travel

The IEEE International Workshop on Defect and Adaptive Test Analysis (DATA-2011) Sep.22-23, 2011 Disneyland Hotel, Anaheim, CA Will be held in conjunction with ITC Test Week (ITC-2011)

Previous Events D3T workshop

Final Program Day 1 - Thursday, Sep. 22 4:00pm - Opening Remarks:   Sankaran Menon (Intel Corporation, USA), General Chair, DATA Jeffrey Roehr (Texas Instruments, USA), Program Chair, DATA 4:15pm - 5:00pm Keynote: Srikanth Venkataraman (Intel Corporation, USA) 5:00pm - 6:30pm Session 1: Adaptive Test: The European View Chair – Al Crouch (Asset-Intertech, USA) 5.00 - 5.30: Online Bivariate Outlier Detection in Final Test Using Kernel Density Estimation                               Harm Bossers, Johann Hurink and Gerard Smit (University of Twente, Netherlands) 5.30 - 6.00: Concurrent Test Method for Test Time Reduction in Production of Mobile Devices                               Amir Owzar, E. Baykal, P. Felicio, R. Teng, G. Valchera, R. Becker (STEricsson, Switzerland) 6.00 - 6.30: A Holistic Approach to use Manufacturing Test Data for the Learning of Yield, Design Issues and                  Improve Test Process Operational Performances                              Davide Appello, Chris Portelli, Domenico Chindamo, Alex Chufarowsky and Marco Esposito (OptimalTest and STMicroelectronics) Day 2 - Friday, Sep. 23 Workshop Welcome Reception - 7:00pm - 9:00pm 8:00am - 9:30am Session 2: ABCs of Adaptive Test Chair – Sankaran Menon (Intel Corporation, USA) 8.00 - 9.00: What Engineers need to know to implement the ITRS roadmap for Adaptive Test                               Jeffrey Roehr (Texas Instruments, USA) 9.00 - 9.30: ATPG and DFT for Adaptive Test: Can we plan ahead in the flow?                               Arani Sinha (Advanced Micro Devices, USA) 9:30am - 10:30am Session 3: Data Mining and Adaptive Test Chair – Jeff Roehr (Texas Instruments, USA) 9.30 - 10.00:   Debug and Data Mining (Invited talk)                                  Nikhil Dakwala (Broadcom, USA) 10.00 - 10.30: Adaptive Test Beyond the Component Level (Invited talk)                                  Mathias Kamm (Cisco, USA) Coffee Break- 10:30am - 10:50am 10:50am - 11:50am Session 4: Noise and Reliability Chair – Al Crouch (Asset-Intertech, USA) 10.50 - 11.20:  Novel Test Structures for Reliability and Noise Analysis (Invited talk)                                   Mohammad Tehranipoor (University of Connecticut)                                   (Collaboration with Xiaoxiao Wang, LeRoy Winemberg, Freescale) 11.20 - 11.50: Analyzing the Impact of Power Supply Noise on Propagation Delay                                  Sushmita Kadiyala Rao, Chaitra Sathyanarayana, Ryan Robucci and Chintan Patel, (University of Maryland, Baltimore) Lunch - 11:50 pm - 1:00pm 1:00pm - 2:30pm Session 5: From Yield to Adaptive Test  Chair – Nisar Ahmed (Freescale, USA) 1.00 - 1.30:  Yield/Area maximization of Logic Circuits: From Theorem to Implementation                               Mohammad Mirza-Aghatabar, Melvin Breuer and Sandeep Gupta (University of Southern California, Los Angeles) 1.30 - 2.00: DACS: Data Aware Component Salvaging in Presence of Microprocessor Integer Functional Unit Delay Faults                              Yue Gao and Melvin Breuer (University of Southern California, Los Angeles) 2.00 - 2.30: Adaptive Group Testing - a DUT Response Technique applied in Semiconductor Test                              Gunther Karner and Ivica Rogina (OptimiSE GmbH, Karlsruhe) 2:30pm - 4:00 pm - Panel Discussion Calling 007: How Secure is Our Data? Organizers: Al Crouch (Asset-Intertech, USA) Jennifer Dworak (Southern Methodist University, USA)