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IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA-2015)
Oct 8-9 2015
Disneyland Hotel, Anaheim, CA |
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Technical Committee |
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PROGRAM CHAIR Jennifer Dworak SMU
VICE-PROGRAM CHAIR Wesley Smith Galaxy
PUBLICITY CHAIR Kanad Chakraborty Lattice Semi
PUBLICATION CHAIR Chintan Patel UMBC |
GENERAL CHAIR Arani Sinha Intel
FINANCE CHAIR Sankaran M. Menon Intel Corporation
LOCAL ARRANGEMENTS CHAIR David Park OptimalPlus
TEST STANDARDS CHAIR Al Crouch Asset-Intertech
EU LIAISON Paul Simon Qualtera |
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PROGRAM COMMITTEE Rob Aitken, ARM Nemat Bidokhti, Cisco Sreejit Chakravarty, LSI John Carulli, TI Patrick Girard, LIRMM, France Ajay Khoche, Consultant Mike Laisne, Qualcomm Amit Nahar, TI Suriyaprakash Natarajan, Intel Jay Orbon, Consultant John Potter, Asset-Intertech Rajesh Raina, Freescale Claude Thibeault, ETS, Canada Li C. Wang, UCSB Xiaoqing Wen, KIT, Japan Qiang Xu, CUHK, Hong Kong |
STEERING COMMITTEE Jeffrey Roehr, Texas Instruments Sankaran Menon, Intel Adit Singh, Auburn Univ. M. Tehranipoor, U Connecticut Hank Walker, Texas A&M Hans Manhaeve, Q-Start Test Jim Plusquellic, U. New Mexico |
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