DATA-2014

 

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IEEE International Workshop on Defects, Adaptive Test and Data Analysis (DATA-2014)

 

October 23-24, 2014

Washington State Convention Center, Seattle, Washington, USA

 

DATA-2014 will be held in conjunction with ITC 2014

 

 

 

 

Final Program

 

 Thursday, Oct 23rd

 

 

5:00pm – Opening Remarks

 

           Arani Sinha (Intel), General Chair DATA-2014,

 

Jeffrey Roehr (Texas Instruments), Program Chair DATA-2014

 

 

5:15-6:00 Keynote Talk: Machine Learning Unraveled

 

        Mark Fetherolf (Numinary Data Science)

 

 

6:00-7:00   Posters & Tables

 

        Optimal Plus, Galaxy, CAST team, KLA-Tencor, Qualtera

 

 

7:00-9:00   Beer and Wine Reception

 

         Both ITC workshops together

 

 

 

Friday, Oct 24th

 

 

8:00-8:45 Invited Talk: Potential of Adaptive Testing for Addressing Cost of Test Crisis

 

         Wojciech Maly (Carnegie Mellon University)

 

 

8:45-9:05 Big Data Analysis in the Age of IoT

 

          Steve Griffith (Syntricity Inc.)

 

 

9:05-9:25 Practical Issues With Selecting & Applying Outlier Methods

 

          Peter  O’Neill (Avago Technologies), Donald W. Hartman (TestCIM Consulting and Salland Engineering)

 

 

9:25-9:45 Learning from Chips Behaving Badly

 

          Harry Chen (MediaTek Inc.), Shih-Hua Kuo (National Chiao Tung University), Jonathan Tung (MediaTek Inc.), Mango C.-T. Chao (National Chiao Tung University)

 

 

9:45-10:30 Invited Talk: Big Data, Big Challenges: Ownership, Security and Quality

 

          Robert Aitken (ARM)

 

 

10:30-11:00 Break

 

 

11:00-11:30 Data Base initiatives for the future of Test

 

           Mark Roos (Roos Instruments)

 

 

11:30-12:00  Intro to RITdb  - Comprehensive Standards to support Monitoring, Analysis and Adaptive Test

 

          Stacy Ajouri (Texas Instruments)

 

 

12:00-1:00 Lunch

 

 

1:00-1:30 Deployment of Custom Algorithms for Very High-Volume Quality Control, Yield Diagnostics, and Equipment Monitoring

 

         Dirk K. de Vries (Qualtera), Lam Ta (Freescale Semiconductor), Dave Kolar (Freescale Semiconductor), Paul Simon (Qualtera)

 

 

1:30-2:00 Automatic assessment of test bimodality for outlier detection application

 

         Ivan Filer (Optimal Plus)

 

 

2:00-2:30  Improving traditional PAT by the use of Multivariate data

 

        Nicolas LeBlond (Galaxy), Jochen Matthias Stefan (Micronas GmbH), Jérôme Kodjabachian (Galaxy)

 

 

2:30-3:00   Break

 

 

3:00-4:00  Panel: Volume diagnosis in the foundry-fabless eco system

 

        Moderator: Geir Eide (Mentor Graphics)