IEEE International Workshop on Defects, Adaptive Test and Data Analysis (DATA-2014)


October 23-24, 2014

Washington State Convention Center, Seattle, Washington, USA


DATA-2014 will be held in conjunction with ITC 2014





Final Program


 Thursday, Oct 23rd



5:00pm – Opening Remarks


           Arani Sinha (Intel), General Chair DATA-2014,


Jeffrey Roehr (Texas Instruments), Program Chair DATA-2014



5:15-6:00 Keynote Talk: Machine Learning Unraveled


        Mark Fetherolf (Numinary Data Science)



6:00-7:00   Posters & Tables


        Optimal Plus, Galaxy, CAST team, KLA-Tencor, Qualtera



7:00-9:00   Beer and Wine Reception


         Both ITC workshops together




Friday, Oct 24th



8:00-8:45 Invited Talk: Potential of Adaptive Testing for Addressing Cost of Test Crisis


         Wojciech Maly (Carnegie Mellon University)



8:45-9:05 Big Data Analysis in the Age of IoT


          Steve Griffith (Syntricity Inc.)



9:05-9:25 Practical Issues With Selecting & Applying Outlier Methods


          Peter  O’Neill (Avago Technologies), Donald W. Hartman (TestCIM Consulting and Salland Engineering)



9:25-9:45 Learning from Chips Behaving Badly


          Harry Chen (MediaTek Inc.), Shih-Hua Kuo (National Chiao Tung University), Jonathan Tung (MediaTek Inc.), Mango C.-T. Chao (National Chiao Tung University)



9:45-10:30 Invited Talk: Big Data, Big Challenges: Ownership, Security and Quality


          Robert Aitken (ARM)



10:30-11:00 Break



11:00-11:30 Data Base initiatives for the future of Test


           Mark Roos (Roos Instruments)



11:30-12:00  Intro to RITdb  - Comprehensive Standards to support Monitoring, Analysis and Adaptive Test


          Stacy Ajouri (Texas Instruments)



12:00-1:00 Lunch



1:00-1:30 Deployment of Custom Algorithms for Very High-Volume Quality Control, Yield Diagnostics, and Equipment Monitoring


         Dirk K. de Vries (Qualtera), Lam Ta (Freescale Semiconductor), Dave Kolar (Freescale Semiconductor), Paul Simon (Qualtera)



1:30-2:00 Automatic assessment of test bimodality for outlier detection application


         Ivan Filer (Optimal Plus)



2:00-2:30  Improving traditional PAT by the use of Multivariate data


        Nicolas LeBlond (Galaxy), Jochen Matthias Stefan (Micronas GmbH), Jérôme Kodjabachian (Galaxy)



2:30-3:00   Break



3:00-4:00  Panel: Volume diagnosis in the foundry-fabless eco system


        Moderator: Geir Eide (Mentor Graphics)