DATA-2014
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IEEE International Workshop on Defects, Adaptive
Test and Data Analysis (DATA-2014) October 23-24, 2014 Washington State Convention Center, Seattle,
Washington, USA DATA-2014 will be held in conjunction with ITC 2014 |
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Final Program Thursday,
Oct 23rd
5:00pm – Opening Remarks Arani Sinha (Intel), General Chair DATA-2014, Jeffrey Roehr (Texas Instruments), Program Chair DATA-2014 5:15-6:00 Keynote Talk: Machine Learning
Unraveled Mark Fetherolf (Numinary Data Science)
6:00-7:00 Posters & Tables Optimal Plus, Galaxy, CAST team, KLA-Tencor, Qualtera 7:00-9:00 Beer and Wine Reception Both ITC workshops together
Friday, Oct 24th 8:00-8:45 Invited Talk: Potential of
Adaptive Testing for Addressing Cost of Test Crisis Wojciech Maly (Carnegie Mellon University) 8:45-9:05 Big Data Analysis in the Age of IoT Steve Griffith (Syntricity Inc.) 9:05-9:25 Practical Issues With Selecting
& Applying Outlier Methods Peter O’Neill (Avago Technologies), Donald W. Hartman (TestCIM Consulting and Salland Engineering)
9:25-9:45 Learning from Chips Behaving Badly Harry Chen (MediaTek Inc.), Shih-Hua Kuo (National Chiao Tung University), Jonathan Tung (MediaTek Inc.), Mango C.-T. Chao (National Chiao Tung University) 9:45-10:30 Invited Talk: Big Data, Big
Challenges: Ownership, Security and Quality Robert Aitken (ARM) 10:30-11:00 Break
11:00-11:30 Data Base initiatives for the
future of Test Mark Roos (Roos Instruments) 11:30-12:00 Intro to RITdb - Comprehensive Standards to support
Monitoring, Analysis and Adaptive Test Stacy Ajouri (Texas Instruments) 12:00-1:00 Lunch 1:00-1:30 Deployment of Custom Algorithms
for Very High-Volume Quality Control, Yield Diagnostics, and Equipment
Monitoring Dirk K. de Vries (Qualtera), Lam Ta (Freescale Semiconductor), Dave Kolar (Freescale Semiconductor), Paul Simon (Qualtera)
1:30-2:00 Automatic assessment of test
bimodality for outlier detection application Ivan Filer (Optimal Plus)
2:00-2:30 Improving traditional PAT by the use
of Multivariate data Nicolas LeBlond (Galaxy), Jochen Matthias Stefan (Micronas GmbH), Jérôme Kodjabachian (Galaxy) 2:30-3:00 Break 3:00-4:00 Panel: Volume diagnosis in the
foundry-fabless eco system Moderator: Geir Eide (Mentor Graphics) |
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