DATA-2013
|
The IEEE International Workshop on Digital and Analog Test and Data Analysis
(DATA-2013) September 12,
2013 Disneyland Hotel, Anaheim, CA Will be held in conjunction with ITC
Test Week (ITC-2013) |
|
|
Final Program Thursday, Sep 12th 8:00am – Opening Remarks Arani
Sinha (Intel), General Chair DATA-2013 Jeffrey Roehr
(Texas Instruments), Program Chair DATA-2013 Session 1: DATA Panel:
Challenges in Adaptive Test 8:15am – 9:00 am:
Wesley Smith (Galaxy Semiconductor), Moderator Session 2: DATA 2013 Opening
Session: 9:00am – 10:30 am: 9:00 to 10: DATA 2013 Keynote: The
challenges of DATA Analysis
Phil Nigh (IBM) 10:00 to 10:30: Real-Time
Outlier Detection
William Tambellini (Galaxy Semiconductor) ITC Coffee Break –
10:30AM to 11:00AM ITC Keynote – 11:00AM to
Noon ITC Lunch – Noon to
1:00PM Session 3: DATA Analysis 1:00pm – 2:30pm 1:00 to 1:30: Next Generation
STDF Stacy Ajouri
(Texas Instruments), Mark Roos (Roos
Instruments), Ajay Khoche (Khoche
Consulting Services) 1:30 to 2:00: Implementation
of Industrial Big-Data Collaborative Analytics Platforms for
Semiconductor Test and
Manufacturing
Paul Simon, Dirk de Vries, Gilles Huron (Qualtera), Stefan Eichenberger
(NXP Semiconductors) 2:00 to 2:30: Data that is too
good to be true Jeffrey Roehr
(Texas Instruments) ITC Coffee Break – 2:30PM
– 3:00PM Session 4: DATA Methods 3:00pm – 4:30 pm 3:00 to 3:30: Asynchronous,
Ripple-Chain Clock Skew Management Approaches in Self-timed Scan Testing
Kanad Chakraborty
(Lattice Semiconductor) 3:30 to 4:00: Iterative
Knowledge Discovery for Screening Customer Returns
Nik Sumikawa (UC
Santa Barbara, Freescale Semiconductor), Jeff Tikkanen (UC Santa Barbara), Li-C. Wang (UC Santa
Barbara), Magdy S. Abadir (Freescale
Semiconductor) 4:00 to 4:30: ATE Predictive
Diagnostics Steve Ledford (Advantest) |
|
|
|