DATA-2013

 

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The IEEE International Workshop on

Digital and Analog Test and Data Analysis (DATA-2013)

 

September 12, 2013 Disneyland Hotel, Anaheim, CA

Will be held in conjunction with ITC Test Week (ITC-2013)

 

 

 

 

 

Final Program

 

 

Thursday, Sep 12th

 

 

8:00am – Opening Remarks

 

Arani Sinha (Intel), General Chair DATA-2013

 

Jeffrey Roehr (Texas Instruments), Program Chair DATA-2013

 

 

 

Session 1: DATA Panel: Challenges in Adaptive Test

 

8:15am – 9:00 am:

 

            Wesley Smith (Galaxy Semiconductor), Moderator

 

 

 

Session 2: DATA 2013 Opening Session:

 

9:00am – 10:30 am:

 

9:00  to 10: DATA 2013 Keynote: The challenges of DATA Analysis

 

            Phil Nigh (IBM)

 

10:00 to 10:30: Real-Time Outlier Detection

 

            William Tambellini (Galaxy Semiconductor)

 

 

 

ITC Coffee Break – 10:30AM to 11:00AM

 

 

 

ITC Keynote – 11:00AM to Noon

 

 

 

ITC Lunch – Noon to 1:00PM

 

 

 

Session 3: DATA Analysis

 

1:00pm – 2:30pm

 

1:00 to 1:30: Next Generation STDF

 

Stacy Ajouri (Texas Instruments), Mark Roos (Roos Instruments), Ajay Khoche (Khoche Consulting Services)

 

1:30 to 2:00: Implementation of Industrial Big-Data Collaborative Analytics Platforms for Semiconductor  Test and Manufacturing

 

            Paul Simon, Dirk de Vries, Gilles Huron (Qualtera), Stefan Eichenberger (NXP Semiconductors)

 

2:00 to 2:30: Data that is too good to be true

 

Jeffrey Roehr (Texas Instruments)

 

 

 

ITC Coffee Break – 2:30PM – 3:00PM

 

 

 

Session 4: DATA Methods

 

3:00pm – 4:30 pm

 

3:00 to 3:30: Asynchronous, Ripple-Chain Clock Skew Management Approaches in Self-timed Scan Testing

 

            Kanad Chakraborty (Lattice Semiconductor)

 

3:30 to 4:00: Iterative Knowledge Discovery for Screening Customer Returns

 

            Nik Sumikawa (UC Santa Barbara, Freescale Semiconductor), Jeff Tikkanen (UC Santa  Barbara), Li-C. Wang (UC Santa Barbara), Magdy S. Abadir   (Freescale Semiconductor)

 

4:00 to 4:30: ATE Predictive Diagnostics

 

            Steve Ledford (Advantest)