The IEEE International Workshop on

Digital and Analog Test and Data Analysis (DATA-2013)


September 12, 2013 Disneyland Hotel, Anaheim, CA

Will be held in conjunction with ITC Test Week (ITC-2013)






Final Program



Thursday, Sep 12th



8:00am – Opening Remarks


Arani Sinha (Intel), General Chair DATA-2013


Jeffrey Roehr (Texas Instruments), Program Chair DATA-2013




Session 1: DATA Panel: Challenges in Adaptive Test


8:15am – 9:00 am:


            Wesley Smith (Galaxy Semiconductor), Moderator




Session 2: DATA 2013 Opening Session:


9:00am – 10:30 am:


9:00  to 10: DATA 2013 Keynote: The challenges of DATA Analysis


            Phil Nigh (IBM)


10:00 to 10:30: Real-Time Outlier Detection


            William Tambellini (Galaxy Semiconductor)




ITC Coffee Break – 10:30AM to 11:00AM




ITC Keynote – 11:00AM to Noon




ITC Lunch – Noon to 1:00PM




Session 3: DATA Analysis


1:00pm – 2:30pm


1:00 to 1:30: Next Generation STDF


Stacy Ajouri (Texas Instruments), Mark Roos (Roos Instruments), Ajay Khoche (Khoche Consulting Services)


1:30 to 2:00: Implementation of Industrial Big-Data Collaborative Analytics Platforms for Semiconductor  Test and Manufacturing


            Paul Simon, Dirk de Vries, Gilles Huron (Qualtera), Stefan Eichenberger (NXP Semiconductors)


2:00 to 2:30: Data that is too good to be true


Jeffrey Roehr (Texas Instruments)




ITC Coffee Break – 2:30PM – 3:00PM




Session 4: DATA Methods


3:00pm – 4:30 pm


3:00 to 3:30: Asynchronous, Ripple-Chain Clock Skew Management Approaches in Self-timed Scan Testing


            Kanad Chakraborty (Lattice Semiconductor)


3:30 to 4:00: Iterative Knowledge Discovery for Screening Customer Returns


            Nik Sumikawa (UC Santa Barbara, Freescale Semiconductor), Jeff Tikkanen (UC Santa  Barbara), Li-C. Wang (UC Santa Barbara), Magdy S. Abadir   (Freescale Semiconductor)


4:00 to 4:30: ATE Predictive Diagnostics


            Steve Ledford (Advantest)