DATA-2013

 

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The IEEE International Workshop on

Digital and Analog Test and Data Analysis (DATA-2013)

 

September 12, 2013 Disneyland Hotel, Anaheim, CA

Will be held in conjunction with ITC Test Week (ITC-2013)

 

 

 

 

 

 

Technical Committee

 

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 PROGRAM CHAIR

 Jeff Roehr

Texas Instruments

GENERAL CHAIR

Arani Sinha

Intel

VICE-PROGRAM CHAIR

Jennifer Dworak

SMU

FINANCE CHAIR

Sankaran M. Menon

Intel Corporation

 

 PUBLICITY CHAIR

Kanad Chakraborty

Lattice Semi

 

PUBLICATION CHAIR

Chintan Patel

UMBC

 

TEST STANDARDS CHAIR

Al Crouch

Asset-Intertech

 

 

PANEL CHAIR

Wesley Smith

Galaxy

 

POSTER CHAIR

Rene Segers

Qualtera

 

EU LIAISON

Stefan Eichenberger

NXP

 

 

PROGRAM COMMITTEE

Rob Aitken, ARM

Nemat Bidokhti, Cisco

Sreejit Chakravarty, LSI

John Carulli, TI

Patrick Girard, LIRMM, France

Ajay Khoche, Consultant

Mike Laisne, Qualcomm

Amit Nahar, TI

Suriyaprakash Natarajan, Intel

Jay Orbon, Consultant

John Potter, Asset-Intertech

Rajesh Raina, Freescale

Claude Thibeault, ETS, Canada

Li C. Wang, UCSB

Xiaoqing Wen, KIT, Japan

Qiang Xu, CUHK, Hong Kong

STEERING COMMITTEE

Sankaran Menon, Intel

Adit Singh, Auburn Univ.

M. Tehranipoor, U Connecticut

Hank Walker, Texas A&M

Hans Manhaeve, Q-Start Test

Jim Plusquellic, U. New Mexico