IEEE International Workshop

on

Defects, Adaptive Test, Yield and Data Analysis

(DATA-2017)

 

Nov 2-3 2017

 

Fort Worth, TX

 

Technical Committee

 

GENERAL CHAIR

Jeffrey Roehr

Test Consultant

 

PROGRAM CHAIR

Wesley Smith

Mentor

 

FINANCE CHAIR

Sagar Kekare

KLA-Tencor

 

PUBLICITY & WEB CHAIR

Sankaran Menon

Intel

 

PUBLICATIONS CHAIR

Chintan Patel

UMBC

 

PANEL CHAIR

Anne Meixner

The Engineers' Daughter LLC

 

LOCAL ARRANGEMENTS CHAIR

David Park

Optimal+

 

TEST STANDARDS CHAIR

Al Crouch

SiliconAid

 

EU LIAISON

Dirk De Vries

Qualtera

 

PROGRAM COMMITTEE

Rob Aitken, ARM

Nemat Bidokhti, Huawei

Sreejit Chakravarty, Intel

John Carulli, Global Foundaries

Patrick Girard, LIRMM, France

Ajay Khoche, Smart Connected Systems

Mike Laisne, Dialog Semi

Rene Segers, Consultant

Amit Nahar, TI

Suriyaprakash Natarajan, Intel

Jay Orbon, Consultant

John Potter, Global Foundries

Rajesh Raina, NXP

Claude Thibeault, ETS, Canada

Li C. Wang, UCSB

Xiaoqing Wen, KIT, Japan

Qiang Xu, CUHK, Hong Kong

 

STEERING COMMITTEE

Jennifer Dworak, SMU

Jeffrey Roehr, Test Consultant

Sankaran Menon, Intel

Adit Singh, Auburn Univ.

M. Tehranipoor, U. Florida

Hank Walker, Texas A&M

Hans Manhaeve, Ridgetop

Jim Plusquellic, U. New Mexico

Home

Call for Paper (pdf)

Paper Submission

ITC 2017

Final Program

Organizing/Program Committee

Registration

Hotel/Travel

Reservation

 

Previous Events

DATA-2016

DATA-2015

DATA-2014

DATA-2013

DATA-2012

DATA-2011

D3T workshop