IEEE International Workshop on Defect and Adaptive Test Analysis (DATA-2011)






Call for Paper (pdf)

Paper Submission

ITC 2011

Final Program

Organizing/Program Committee

Registration (For workshop only or with ITC)



Previous Events

D3T workshop















September 22-23, 2011

Disneyland Hotel, Anaheim, CA Convention Center, TX


Description: Description: F:\Chintan\conferences\data2012\Webpage\data2011\pic1.gif


Submission Deadline : August 31, 2011

Notification of Acceptance: September 6, 2011

Camera Ready Paper: September 15, 2011


DATA-2011 will be held in conjunction with ITC 2011





New initiatives in getting more out of testing have opened up new avenues of research and development in the areas of extracting information about defects and IC behavior through the use of innovative analysis techniques. As the need for these novel processes is becoming more widely accepted in the industry, new questions about how these techniques should be executed and controlled in production, the types and sizes of database requirements, and even the format of test data and storage itself are being reviewed and discussed. New issues such as the control and documentation of dynamic test changes in response to local test data, ensuring high quality levels without test escapes, and the practical and realistic limitations of these new ideas are for board/system are now being discussed by many people in the industry. Even the definition of what is “Adaptive testing” is still being reviewed and defined. Closing the knowledge gap about these issues, the process, new test techniques, database requirements, and how defect models are being used to adapt test flows will be the goals of this year’s DATA workshop.


The IEEE International Workshop on Defect & Adaptive Test Analysis (DATA 2011) is aimed at addressing the above issues. Paper presentations on topics related to the topics listed below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade.


·   Outlier Identification

·   Data-Driven Testing (DDT)

·   Test Data Analysis

·   Yield Learning and Analysis Using DDT

·   Adaptive Test Database Requirements

·   Data-Mining Methods for Test Data Processing

·   Low Voltage Testing and Stress Testing

·   Transition and Delay Fault Testing

·   Reliability and Yield

·   Nanometer Test Challenges

·   Defect Coverage & Metrics

·   Mixed Current/Voltage Testing

·   Economics of Defect Based Testing

·   Fault Localization & Diagnosis

·   Noise and Crosstalk Testing

·   In System or On-board Testing

To present at the workshop, submit a PDF version of an extended abstract of at least 1000 words via Easy Chair by Aug. 31, 2011. Each submission should include full name and address of each author, affiliation, telephone number, FAX and Email address. Camera-ready papers for inclusion in the digest of papers will be due on Sept. 15, 2011. Presentations on cutting edge test technology, innovative test ideas, and industrial practices and experience are welcome. Proposals for Embedded Tutorials, Debates, Panel Discussions or “Spot-Light” presentations describing industrial experiences are also invited.


Technical Program Submissions:

Jeff Roehr

Texas Instruments


Visit our www site at:


General Information:

Sankaran Menon

Intel Corp.