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IEEE International Workshop on Defects, Adaptive Test, Yield and Data Analysis (DATA-2016)
Nov 17-18 2016
Fort Worth, TX |
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Technical Committee |
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PROGRAM CHAIR Arani Sinha Intel
VICE-PROGRAM CHAIR Wesley Smith Galaxy
PUBLICITY & WEB CHAIR Sankaran Menon Intel
PUBLICATION CHAIR Chintan Patel UMBC
PANEL CHAIR Anne Meixner The Engineers' Daughter LLC |
GENERAL CHAIR Jennifer Dworak SMU
FINANCE CHAIR Sagar Kekare KLA-Tencor
LOCAL ARRANGEMENTS CHAIR David Park Optimal+
TEST STANDARDS CHAIR Al Crouch SiliconAid
EU LIAISON Rene Segers Qualtera |
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PROGRAM COMMITTEE Rob Aitken, ARM Nemat Bidokhti, Cisco Sreejit Chakravarty, LSI John Carulli, Global Foundaries Patrick Girard, LIRMM, France Ajay Khoche, Consultant Mike Laisne, Qualcomm Amit Nahar, TI Suriyaprakash Natarajan, Intel Jay Orbon, Consultant John Potter, Asset-Intertech Rajesh Raina, NXP Claude Thibeault, ETS, Canada Li C. Wang, UCSB Xiaoqing Wen, KIT, Japan Qiang Xu, CUHK, Hong Kong |
STEERING COMMITTEE Jeffrey Roehr, Texas Instruments Sankaran Menon, Intel Adit Singh, Auburn Univ. M. Tehranipoor, U Connecticut Hank Walker, Texas A&M Hans Manhaeve, Q-Star Test Jim Plusquellic, U. New Mexico |
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